Issued Patents All Time
Showing 26–50 of 395 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11559972 | Multilayer structure and use of same | Naoki Kawakami | 2023-01-24 |
| 11534896 | Rotation tool | Jun Shinohara | 2022-12-27 |
| 11445903 | Vision test device | Seiji Morino, Mitsuru Sugawara, Kinya Hasegawa | 2022-09-20 |
| 11428926 | Image projection device | Megumi Yamamoto, Seiji Morino, Chizuru Kaneko | 2022-08-30 |
| 11352477 | Resin composition and use of same | Makoto Okamoto, Hirotaka Shiota | 2022-06-07 |
| 11282671 | Charged-particle beam apparatus | Uki Ikeda, Daisuke Bizen, Makoto Sakakibara | 2022-03-22 |
| 11257658 | Charged particle beam apparatus | Noritsugu Takahashi, Makoto Sakakibara, Minoru Yamazaki | 2022-02-22 |
| 11211226 | Pattern cross-sectional shape estimation system and program | Toshiyuki Yokosuka, Hirohiko Kitsuki, Daisuke Bizen, Yusuke Abe, Kenji Yasui +2 more | 2021-12-28 |
| 11211225 | Charged particle beam control device | Shinichi Murakami, Shunsuke Mizutani, Akio Yamamoto, Wen Li | 2021-12-28 |
| 11177112 | Pattern measurement device and non-transitory computer readable medium having stored therein program for executing measurement | Satoru Yamaguchi, Kei Sakai, Ryota Watanabe | 2021-11-16 |
| 11164720 | Scanning electron microscope and calculation method for three-dimensional structure depth | Kenji Yasui, Mayuka Osaki, Hirohiko Kitsuki, Toshiyuki Yokosuka, Daisuke Bizen +1 more | 2021-11-02 |
| 11158034 | Image inspection device, image inspection method, and image inspection device component | Seiji Morino, Manabu Ishimoto | 2021-10-26 |
| 11149143 | Resin composition, method for producing same and multi-layered structure using same | Yu Ito, Makoto Okamoto | 2021-10-19 |
| 11139144 | Charged particle beam apparatus | Shunsuke Mizutani, Shahedul Hoque, Uki Ikeda | 2021-10-05 |
| 11129527 | Visual field/visual acuity examination system, visual field/visual acuity examination device, visual field/visual acuity examination method, visual field/visual acuity examination program, and server device | Mitsuru Sugawara, Kinya Hasegawa | 2021-09-28 |
| 11062892 | Charged particle detector including a light-emitting section having lamination structure, charged particle beam device, and mass spectrometer | Shin Imamura, Takashi Ohshima, Tomonobu Tsuchiya, Hajime Kawano | 2021-07-13 |
| 11020942 | Laminate, multilayered structure, and method for producing the same | Yasuhiro Nonaka | 2021-06-01 |
| 11019995 | Retinal scanning type eye examination device, retinal scanning type eye examination system, eyewear provision system, and retinal scanning type eyewear | Hironori Miyauchi, Kenji Yasui, Mitsuru Sugawara | 2021-06-01 |
| 10991543 | Charged particle beam device | Shunsuke Mizutani, Yuuji KASAI, Minoru Yamazaki | 2021-04-27 |
| 10991542 | Charged particle beam device | Ryota Watanabe, Yuko Sasaki, Kazunari Asao, Wataru MORI, Minoru Yamazaki | 2021-04-27 |
| 10984979 | Charged particle detector and charged particle beam apparatus | Shin Imamura, Takashi Ohshima, Tomonobu Tsuchiya, Hajime Kawano, Shahedul Hoque +1 more | 2021-04-20 |
| 10921598 | Image projection device | Megumi Yamamoto | 2021-02-16 |
| 10924716 | Image projection device | Kinya Hasegawa | 2021-02-16 |
| 10903041 | Pattern measuring method, pattern measuring tool and computer readable medium | Uki Ikeda, Shunsuke Mizutani | 2021-01-26 |
| 10831364 | Terminal device | Masanori Kawahara, Rie Hasada | 2020-11-10 |