Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12405535 | Method for filtering an image and associated metrology apparatus | Armand Eugene Albert Koolen, Justin Kreuzer, Nikhil Mehta, Patrick Warnaar, Patricius Aloysius Jacobus Tinnemans +1 more | 2025-09-02 |
| 12399434 | Method of determining a characteristic of a structure, and metrology apparatus | Johannes F. de Boer, Arie Jeffrey Den Boef, Christos MESSINIS | 2025-08-26 |
| 12366811 | Metrology system and method for determining a characteristic of one or more structures on a substrate | Patricius Aloysius Jacobus Tinnemans, Arie Jeffrey Den Boef, Armand Eugene Albert Koolen, Nitesh Pandey, Willem Marie Julia Marcel Coene +1 more | 2025-07-22 |
| 12066764 | Metrology apparatus and method for determining a characteristic of one or more structures on a substrate | Patricius Aloysius Jacobus Tinnemans, Patrick Warnaar, Maurits Van Der Schaar | 2024-08-20 |
| 12007700 | Metrology system and method for determining a characteristic of one or more structures on a substrate | Patricius Aloysius Jacobus Tinnemans, Arie Jeffrey Den Boef, Armand Eugene Albert Koolen, Nitesh Pandey, Willem Marie Julia Marcel Coene +1 more | 2024-06-11 |
| 11709436 | Metrology apparatus and method for determining a characteristic of one or more structures on a substrate | Patricius Aloysius Jacobus Tinnemans, Patrick Warnaar, Maurits Van Der Schaar | 2023-07-25 |
| 11650047 | Metrology apparatus and method for determining a characteristic of one or more structures on a substrate | Patricius Aloysius Jacobus Tinnemans, Arie Jeffrey Den Boef, Hugo Augustinus Joseph Cramer, Patrick Warnaar, Grzegorz Grzela +1 more | 2023-05-16 |
| 11415900 | Metrology system and method for determining a characteristic of one or more structures on a substrate | Patricius Aloysius Jacobus Tinnemans, Arie Jeffrey Den Boef, Armand Eugene Albert Koolen, Nitesh Pandey, Willem Marie Julia Marcel Coene +1 more | 2022-08-16 |
| 11125806 | Metrology apparatus and method for determining a characteristic of one or more structures on a substrate | Patricius Aloysius Jacobus Tinnemans, Patrick Warnaar, Maurits Van Der Schaar | 2021-09-21 |
| 11119415 | Method of determining a characteristic of a structure, and metrology apparatus | Johannes F. de Boer, Arie Jeffrey Den Boef, Christos MESSINIS | 2021-09-14 |
| 11009343 | Metrology apparatus and method for determining a characteristic of one or more structures on a substrate | Patricius Aloysius Jacobus Tinnemans, Arie Jeffrey Den Boef, Hugo Augustinus Joseph Cramer, Patrick Warnaar, Grzegorz Grzela +1 more | 2021-05-18 |
| 10816909 | Metrology system and method for determining a characteristic of one or more structures on a substrate | Patricius Aloysius Jacobus Tinnemans, Arie Jeffrey Den Boef, Armand Eugene Albert Koolen, Nitesh Pandey, Willem Marie Julia Marcel Coene +1 more | 2020-10-27 |