Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12399434 | Method of determining a characteristic of a structure, and metrology apparatus | Johannes F. de Boer, Vasco Tomas Tenner, Arie Jeffrey Den Boef | 2025-08-26 |
| 11119415 | Method of determining a characteristic of a structure, and metrology apparatus | Johannes F. de Boer, Vasco Tomas Tenner, Arie Jeffrey Den Boef | 2021-09-14 |