CP

Christophe Pomarede

AA Asm America: 16 patents #13 of 181Top 8%
AN Asm International N.V.: 2 patents #83 of 197Top 45%
AB Asm Ip Holding B.V.: 2 patents #310 of 620Top 50%
Overall (All Time): #222,668 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9873942 Methods of vapor deposition with multiple vapor sources Eric James Shero, Mohith Verghese, Jan Willem Maes, Chang-Gong Wang 2018-01-23
9238865 Multiple vapor sources for vapor deposition Eric James Shero, Mohith Verghese, Jan Willem Maes, Chang-Gong Wang 2016-01-19
7964513 Method to form ultra high quality silicon-containing compound layers Michael A. Todd, Keith Doran Weeks, Christiaan J. Werkhoven 2011-06-21
7790556 Integration of high k gate dielectric Michael Eugene Givens, Eric James Shero, Michael A. Todd 2010-09-07
7651953 Method to form ultra high quality silicon-containing compound layers Michael A. Todd, Keith Doran Weeks, Christiaan J. Werkhoven 2010-01-26
7629270 Remote plasma activated nitridation Johan Swerts, Hilde De Witte, Jan Willem Maes, Ruben Haverkort, Yuet Wan +3 more 2009-12-08
7569284 Incorporation of nitrogen into high k dielectric film Eric James Shero 2009-08-04
7476627 Surface preparation prior to deposition Jeff Roberts, Eric James Shero 2009-01-13
7405453 Incorporation of nitrogen into high k dielectric film Eric James Shero 2008-07-29
7297641 Method to form ultra high quality silicon-containing compound layers Michael A. Todd, Keith Doran Weeks, Christiaan J. Werkhoven 2007-11-20
7294582 Low temperature silicon compound deposition Ruben Haverkort, Yuet Wan, Marinus De Blank, Cornelius A. van der Jeugd, Jacobus Johannes Beulens +3 more 2007-11-13
7056835 Surface preparation prior to deposition Jeff Roberts, Eric James Shero 2006-06-06
7026219 Integration of high k gate dielectric Michael Eugene Givens, Eric James Shero, Michael A. Todd 2006-04-11
7022613 Reduced cross-contamination between chambers in a semiconductor processing tool Eric James Shero, Olli Jylhä 2006-04-04
6960537 Incorporation of nitrogen into high k dielectric film Eric James Shero 2005-11-01
6958277 Surface preparation prior to deposition Jeff Roberts, Eric James Shero 2005-10-25
6825051 Plasma etch resistant coating and process Fred AmRhein 2004-11-30
6806145 Low temperature method of forming a gate stack with a high k layer deposited over an interfacial oxide layer Suvi Haukka, Eric James Shero, Jan Willem Hub Maes, Marko Tuominen 2004-10-19
6797617 Reduced cross-contamination between chambers in a semiconductor processing tool Eric James Shero, Olli Jylhä 2004-09-28
6613695 Surface preparation prior to deposition Jeff Roberts, Eric James Shero 2003-09-02