Uwe Hollerbach — 15 Patents at Applied Materials

Uwe Hollerbach has been granted 15 US patents while listed as an inventor at Applied Materials. The first was granted in 2007 and the most recent in July 2025. Uwe Hollerbach ranks #307,048 of 4,157,543 US inventors in our database (top 7.4%). Patent records list Uwe Hollerbach in Fremont, CA, US.

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12372779	Controlling light source wavelengths for selectable phase shifts between pixels in digital lithography systems	Thomas Laidig, Christopher Dennis Bencher, Hwan J. Jeong	2025-07-29
12360467	Dynamic generation of layout adaptive packaging	Thomas Laidig	2025-07-15
12242789	Overlaying on locally dispositioned patterns by ML based dynamic digital corrections (ML-DDC)	Tamer Coskun, Aidyn Kemeldinov, Chung-Shin Kang, Thomas Laidig	2025-03-04
11934762	Overlaying on locally dispositioned patterns by ML based dynamic digital corrections (ML-DDC)	Tamer Coskun, Aidyn Kemeldinov, Chung-Shin Kang, Thomas Laidig	2024-03-19	$54,086,000
11899198	Controlling light source wavelengths for selectable phase shifts between pixels in digital lithography systems	Thomas Laidig, Christopher Dennis Bencher, Hwan J. Jeong	2024-02-13	$47,589,000
11899379	Dynamic generation of layout adaptive packaging	Thomas Laidig	2024-02-13	$47,589,000
11599032	Dynamic generation of layout adaptive packaging	Thomas Laidig	2023-03-07	$32,704,000
10678150	Dynamic generation of layout adaptive packaging	Thomas Laidig	2020-06-09	$53,212,000
10331038	Real time software and array control	Thomas Laidig, Mark Hunt, Don STARSES	2019-06-25	$45,457,000
8799832	Optical proximity correction for topographically non-uniform substrates	Yuri Granik, Konstantinos Adam	2014-08-05	$5,453,000
7856606	Apparatus, method and program product for suppressing waviness of features to be printed using photolithographic systems	Markus Franciscus Antonius Eurlings, Melchior Mulder, Thomas Laidig	2010-12-21
7820341	Method of two dimensional feature model calibration and optimization	Thomas Laidig, Jang Fung Chen, Xuelong Shi, Ralph Schlief, Kurt E. Wampler	2010-10-26
7376930	Method, program product and apparatus for generating assist features utilizing an image field map	Kurt E. Wampler, Douglas Van Den Broeke, Xuelong Shi, Jang Fung Chen	2008-05-20
7349066	Apparatus, method and computer program product for performing a model based optical proximity correction factoring neighbor influence	Markus Franciscus Antonius Eurlings, Thomas Laidig	2008-03-25
7175940	Method of two dimensional feature model calibration and optimization	Thomas Laidig, Jang Fung Chen, Xuelong Shi, Ralph Schlief, Kurt E. Wampler	2007-02-13

Uwe Hollerbach — 15 Patents

Issued Patents All Time

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