Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9397012 | Test pattern for feature cross-sectioning | Deniz E. Civay | 2016-07-19 |
| 7820341 | Method of two dimensional feature model calibration and optimization | Thomas Laidig, Jang Fung Chen, Xuelong Shi, Uwe Hollerbach, Kurt E. Wampler | 2010-10-26 |
| 7175940 | Method of two dimensional feature model calibration and optimization | Thomas Laidig, Jang Fung Chen, Xuelong Shi, Uwe Hollerbach, Kurt E. Wampler | 2007-02-13 |