Issued Patents All Time
Showing 26–43 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8569187 | Thermal processing apparatus | Stephen Moffatt, Douglas E. Holmgren, Samuel C. Howells, Edric Tong, Bruce E. Adams +1 more | 2013-10-29 |
| 8432613 | Multi-stage optical homogenization | Dean Jennings, Timothy N. Thomas, Samuel C. Howells, Bruce E. Adams | 2013-04-30 |
| 8363320 | Method and apparatus for decorrelation of spatially and temporally coherent light | Dean Jennings, Timothy N. Thomas, Stephen Moffatt, Bruce E. Adams, Samuel C. Howells | 2013-01-29 |
| 8254767 | Method and apparatus for extended temperature pyrometry | Aaron Muir Hunter, Rajesh S. Ramanujam, Thomas Haw | 2012-08-28 |
| 8232503 | Pyrometer for laser annealing system | Bruce E. Adams, Timothy N. Thomas, Aaron Muir Hunter, Abhilash J. Mayur, Rajesh S. Ramanujam | 2012-07-31 |
| 8148663 | Apparatus and method of improving beam shaping and beam homogenization | Bruce E. Adams, Samuel C. Howells, Dean Jennings, Timothy N. Thomas, Stephen Moffatt | 2012-04-03 |
| 8067302 | Defect-free junction formation using laser melt annealing of octadecaborane self-amorphizing implants | — | 2011-11-29 |
| 7804042 | Pryometer for laser annealing system compatible with amorphous carbon optical absorber layer | Bruce E. Adams, Timothy N. Thomas, Aaron Muir Hunter, Abhilash J. Mayur, Rajesh S. Ramanujam | 2010-09-28 |
| 7465591 | Evaluating a geometric or material property of a multilayered structure | Peter G. Borden | 2008-12-16 |
| 7379185 | Evaluation of openings in a dielectric layer | Peter G. Borden, Edgar Genio | 2008-05-27 |
| 7026175 | High throughput measurement of via defects in interconnects | Peter G. Borden, Edgar Genio | 2006-04-11 |
| 6940592 | Calibration as well as measurement on the same workpiece during fabrication | Peter G. Borden, Jon Madsen | 2005-09-06 |
| 6911349 | Evaluating sidewall coverage in a semiconductor wafer | Peter G. Borden | 2005-06-28 |
| 6906801 | Measuring a property of a layer in multilayered structure | Peter G. Borden | 2005-06-14 |
| 6812047 | Evaluating a geometric or material property of a multilayered structure | Peter G. Borden | 2004-11-02 |
| 6489801 | Apparatus and method for evaluating a semiconductor wafer | Peter G. Borden, Regina G. Nijmeijer | 2002-12-03 |
| 6054868 | Apparatus and method for measuring a property of a layer in a multilayered structure | Peter G. Borden | 2000-04-25 |
| 6049220 | Apparatus and method for evaluating a wafer of semiconductor material | Peter G. Borden, Regina G. Nijmeijer | 2000-04-11 |