Issued Patents All Time
Showing 51–69 of 69 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6093647 | Method to selectively electroplate conductive material into trenches | Allen S. Yu | 2000-07-25 |
| 6091138 | Multi-chip packaging using bump technology | Allen S. Yu, Thomas C. Scholer | 2000-07-18 |
| 6084679 | Universal alignment marks for semiconductor defect capture and analysis | Allen S. Yu | 2000-07-04 |
| 6063685 | Device level identification methodology | Michael G. McIntyre, Charlie Reading | 2000-05-16 |
| 6041270 | Automatic recipe adjust and download based on process control window | Ming Chen | 2000-03-21 |
| 6035244 | Automatic defect reclassification of known propagator defects | Ming Chen | 2000-03-07 |
| 6025272 | Method of planarize and improve the effectiveness of the stop layer | Allen S. Yu, Thomas C. Scholer | 2000-02-15 |
| 6025259 | Dual damascene process using high selectivity boundary layers | Allen S. Yu, Thomas C. Scholer | 2000-02-15 |
| 6013570 | LDD transistor using novel gate trim technique | Allen S. Yu, Patrick K. Cheung | 2000-01-11 |
| 6011619 | Semiconductor wafer optical scanning system and method using swath-area defect limitation | Bryan Tracy, Ming Chen | 2000-01-04 |
| 5999003 | Intelligent usage of first pass defect data for improved statistical accuracy of wafer level classification | Ming Chen | 1999-12-07 |
| 5985753 | Method to manufacture dual damascene using a phantom implant mask | Allen S. Yu, Thomas C. Scholer | 1999-11-16 |
| 5972728 | Ion implantation feedback monitor using reverse process simulation tool | Ming Chen | 1999-10-26 |
| 5966459 | Automatic defect classification (ADC) reclassification engine | Ming Chen | 1999-10-12 |
| 5946213 | Intelligent adc reclassification of previously classified propagator defects | Ming Chen | 1999-08-31 |
| 5905434 | Vehicle communication device | Ming Chen | 1999-05-18 |
| 5866437 | Dynamic process window control using simulated wet data from current and previous layer data | Ming Chen | 1999-02-02 |
| 5862055 | Automatic defect classification individual defect predicate value retention | Ming Chen, Steven J. Zika | 1999-01-19 |
| 5776811 | Simplified process for fabricating flash eeprom cells | Hsingya Arthur Wang, Jian Chen | 1998-07-07 |