Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6947804 | Method for detecting sequential processing effects using on-tool randomization | James M. Pak | 2005-09-20 |
| 6496596 | Method for detecting and categorizing defects | Christopher Lee Pike | 2002-12-17 |
| 6040912 | Method and apparatus for detecting process sensitivity to integrated circuit layout using wafer to wafer defect inspection device | C. Bradford Hopper | 2000-03-21 |
| 5862055 | Automatic defect classification individual defect predicate value retention | Ming Chen, Paul J. Steffan | 1999-01-19 |