MV

Martin L. Voogel

AM AMD: 51 patents #133 of 9,279Top 2%
TA Tabula: 17 patents #7 of 42Top 20%
IN Intel: 5 patents #7,174 of 30,777Top 25%
📍 Los Altos, CA: #109 of 3,651 inventorsTop 3%
🗺 California: #4,078 of 386,348 inventorsTop 2%
Overall (All Time): #27,084 of 4,157,543Top 1%
73
Patents All Time

Issued Patents All Time

Showing 26–50 of 73 patents

Patent #TitleCo-InventorsDate
8344755 Configuration context switcher Trevis Chandler, Jason Redgrave 2013-01-01
8324931 Configuration context switcher with a latch Jason Redgrave, Trevis Chandler 2012-12-04
8248101 Reading configuration data from internal storage node of configuration storage circuit Jason Redgrave, Trevis Chandler 2012-08-21
8138789 Configuration context switcher with a clocked storage element Trevis Chandler, Joe Entjer, Jason Redgrave 2012-03-20
7928761 Configuration context switcher with a latch Jason Redgrave, Trevis Chandler 2011-04-19
7907461 Structures and methods of preventing an unintentional state change in a data storage node of a latch Chi M. Nguyen 2011-03-15
7859918 Method and apparatus for trimming die-to-die variation of an on-chip generated voltage reference Leon Ly Nguyen 2010-12-28
7825685 Configuration context switcher with a clocked storage element Trevis Chandler, Joe Entjer, Jason Redgrave 2010-11-02
7504877 Charge pump and voltage regulator for body bias voltage Ly Nguyen 2009-03-17
7452765 Single event upset in SRAM cells in FPGAs with high resistivity gate structures Austin H. Lesea, Joseph J. Fabula, Carl H. Carmichael, Shahin Toutounchi, Michael J. Hart +3 more 2008-11-18
7400123 Voltage regulator with variable drive strength for improved phase margin in integrated circuits 2008-07-15
7385416 Circuits and methods of implementing flip-flops in dual-output lookup tables Manoj Chirania 2008-06-10
7378869 Lookup table circuits programmable to implement flip-flops Manoj Chirania 2008-05-27
7376000 Memory cells utilizing metal-to-metal capacitors to reduce susceptibility to single event upsets Steven P. Young 2008-05-20
7301796 Memory cells utilizing metal-to-metal capacitors to reduce susceptibility to single event upsets Steven P. Young 2007-11-27
7283409 Data monitoring for single event upset in a programmable logic device David P. Schultz, Vasisht Mantra Vadi, Philip D. Costello, Venu M. Kondapalli 2007-10-16
7239173 Programmable memory element with power save mode in a programmable logic device 2007-07-03
7119570 Method of measuring performance of a semiconductor device and circuit for the same Manoj Chirania, Venu M. Kondapalli, Philip D. Costello 2006-10-10
7109783 Method and apparatus for voltage regulation within an integrated circuit Venu M. Kondapalli, Philip D. Costello 2006-09-19
7109746 Data monitoring for single event upset in a programmable logic device David P. Schultz, Vasisht Mantra Vadi, Philip D. Costello, Venu M. Kondapalli 2006-09-19
7110281 Memory cells utilizing metal-to-metal capacitors to reduce susceptibility to single event upsets Steven P. Young 2006-09-19
7064574 PLD memory cells utilizing metal-to-metal capacitors to selectively reduce susceptibility to single event upsets Steven P. Young 2006-06-20
7053654 PLD lookup table including transistors of more than one oxide thickness Steven P. Young, Venu M. Kondapalli 2006-05-30
6982451 Single event upset in SRAM cells in FPGAs with high resistivity gate structures Austin H. Lesea, Joseph J. Fabula, Carl H. Carmichael, Shahin Toutounchi, Michael J. Hart +3 more 2006-01-03
6949951 Integrated circuit multiplexer including transistors of more than one oxide thickness Steven P. Young, Michael J. Hart, Venu M. Kondapalli 2005-09-27