Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7859918 | Method and apparatus for trimming die-to-die variation of an on-chip generated voltage reference | Martin L. Voogel | 2010-12-28 |
| 7002219 | Electrical fuse for integrated circuits | Jan Lodewijk de Jong, James Karp | 2006-02-21 |
| 6509739 | Method for locating defects and measuring resistance in a test structure | Martin L. Voogel, Narasimhan Vasudevan | 2003-01-21 |