Kaustuve Bhattacharyya

Issued Patents 2025

Showing 1–5 of 5 patents

Patent #	Title	Co-Inventors	Date
12429328	Metrology method, target and substrate	Henricus Wilhelmus Maria Van Buel, Christophe David Fouquet, Hendrik Jan Hidde Smilde, Maurits Van Der Schaar, Arie Jeffrey Den Boef +7 more	2025-09-30
12276921	Substrate comprising a target arrangement, and associated at least one patterning device, lithographic method and metrology method	Olger Victor Zwier, Maurits Van Der Schaar, Hilko Dirk Bos, Hans Van Der Laan, S. M. Masudur Rahman Al Arif +6 more	2025-04-15
12204826	Method and apparatus for inspection and metrology	Lotte Marloes Willems, Panagiotis Pieter Bintevinos, Guangqing Chen, Martin Ebert, Pieter Jacob Mathias Hendrik Knelissen +5 more	2025-01-21
12189305	Metrology method and apparatus and computer program	Simon Gijsbert Josephus Mathijssen, Patricius Aloysius Jacobus Tinnemans, Arie Jeffrey Den Boef, Samee Ur Rehman	2025-01-07
12189314	Metrology method and associated metrology and lithographic apparatuses	Sebastianus Adrianus GOORDEN, Simon Gijsbert Josephus Mathijssen, Leendert Jan KARSSEMEIJER, Manouk RIJPSTRA, Ralph Brinkhof	2025-01-07