Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12189314 | Metrology method and associated metrology and lithographic apparatuses | Sebastianus Adrianus GOORDEN, Simon Gijsbert Josephus Mathijssen, Manouk RIJPSTRA, Ralph Brinkhof, Kaustuve Bhattacharyya | 2025-01-07 |