Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12189305 | Metrology method and apparatus and computer program | Patricius Aloysius Jacobus Tinnemans, Arie Jeffrey Den Boef, Kaustuve Bhattacharyya, Samee Ur Rehman | 2025-01-07 |
| 12189314 | Metrology method and associated metrology and lithographic apparatuses | Sebastianus Adrianus GOORDEN, Leendert Jan KARSSEMEIJER, Manouk RIJPSTRA, Ralph Brinkhof, Kaustuve Bhattacharyya | 2025-01-07 |