Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12405535 | Method for filtering an image and associated metrology apparatus | Armand Eugene Albert Koolen, Justin Kreuzer, Nikhil Mehta, Patrick Warnaar, Vasco Tomas Tenner +1 more | 2025-09-02 |
| 12366811 | Metrology system and method for determining a characteristic of one or more structures on a substrate | Arie Jeffrey Den Boef, Armand Eugene Albert Koolen, Nitesh Pandey, Vasco Tomas Tenner, Willem Marie Julia Marcel Coene +1 more | 2025-07-22 |
| 12189305 | Metrology method and apparatus and computer program | Simon Gijsbert Josephus Mathijssen, Arie Jeffrey Den Boef, Kaustuve Bhattacharyya, Samee Ur Rehman | 2025-01-07 |