Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12366811 | Metrology system and method for determining a characteristic of one or more structures on a substrate | Patricius Aloysius Jacobus Tinnemans, Arie Jeffrey Den Boef, Armand Eugene Albert Koolen, Nitesh Pandey, Vasco Tomas Tenner +1 more | 2025-07-22 |
| 12326407 | Inspection apparatus and inspection method | Nitish Kumar, Richard Quintanilha, Markus Gerardus Martinus Maria Van Kraaij, Konstantin Tsigutkin | 2025-06-10 |