Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12405535 | Method for filtering an image and associated metrology apparatus | Armand Eugene Albert Koolen, Justin Kreuzer, Nikhil Mehta, Patrick Warnaar, Patricius Aloysius Jacobus Tinnemans +1 more | 2025-09-02 |
| 12399434 | Method of determining a characteristic of a structure, and metrology apparatus | Johannes F. de Boer, Arie Jeffrey Den Boef, Christos MESSINIS | 2025-08-26 |
| 12366811 | Metrology system and method for determining a characteristic of one or more structures on a substrate | Patricius Aloysius Jacobus Tinnemans, Arie Jeffrey Den Boef, Armand Eugene Albert Koolen, Nitesh Pandey, Willem Marie Julia Marcel Coene +1 more | 2025-07-22 |