Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12399434 | Method of determining a characteristic of a structure, and metrology apparatus | Vasco Tomas Tenner, Arie Jeffrey Den Boef, Christos MESSINIS | 2025-08-26 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12399434 | Method of determining a characteristic of a structure, and metrology apparatus | Vasco Tomas Tenner, Arie Jeffrey Den Boef, Christos MESSINIS | 2025-08-26 |