Issued Patents 2025
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12366811 | Metrology system and method for determining a characteristic of one or more structures on a substrate | Patricius Aloysius Jacobus Tinnemans, Arie Jeffrey Den Boef, Armand Eugene Albert Koolen, Vasco Tomas Tenner, Willem Marie Julia Marcel Coene +1 more | 2025-07-22 |
| 12339588 | High force low voltage piezoelectric micromirror actuator | Luc Haspeslagh, Ties Wouter VAN DER WOORD, Halil Gökay YEGEN, Guilherme Brondani Torri, Sebastianus Adrianus GOORDEN +3 more | 2025-06-24 |
| 12276784 | Micromirror arrays | Luc Haspeslagh, Veronique Rochus, Guilherme Brondani Torri, Sebastianus Adrianus GOORDEN | 2025-04-15 |
| 12259546 | Micromirror arrays | Alexandre Halbach, Sebastianus Adrianus GOORDEN, Veronique Rochus, Luc Haspeslagh, Guilherme Brondani Torri | 2025-03-25 |