Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12204826 | Method and apparatus for inspection and metrology | Kaustuve Bhattacharyya, Panagiotis Pieter Bintevinos, Guangqing Chen, Martin Ebert, Pieter Jacob Mathias Hendrik Knelissen +5 more | 2025-01-21 |