Issued Patents 2021
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11183362 | Charged particle beam apparatus and sample observation method using the same | Katsura Takaguchi, Masahiro Sasajima, Toshihide Agemura | 2021-11-23 |
| 11043358 | Measuring apparatus and method of setting observation condition | Ryoko Araki, Yohei Nakamura, Masahiro Sasajima, Mitsuhiro Nakamura, Toshihide Agemura | 2021-06-22 |
| 11043359 | Charged particle beam apparatus and charged particle beam inspection system | Yohei Nakamura, Heita Kimizuka, Takafumi Miwa, Muneyuki Fukuda, Junichi Tanaka | 2021-06-22 |
| 11011348 | Scanning electron microscope and sample observation method using scanning electron microscope | Daisuke Bizen, Takafumi Miwa, Makoto Sakakibara, Toshiyuki Yokosuka, Hideyuki Kazumi | 2021-05-18 |
| 10971347 | Charged particle beam apparatus | Mitsuhiro Nakamura, Hironori ITABASHI, Hirofumi Satou, Tsutomu Saito, Masahiro Sasajima +1 more | 2021-04-06 |