Issued Patents 2021
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11211226 | Pattern cross-sectional shape estimation system and program | Hirohiko Kitsuki, Daisuke Bizen, Makoto Suzuki, Yusuke Abe, Kenji Yasui +2 more | 2021-12-28 |
| 11164720 | Scanning electron microscope and calculation method for three-dimensional structure depth | Kenji Yasui, Mayuka Osaki, Makoto Suzuki, Hirohiko Kitsuki, Daisuke Bizen +1 more | 2021-11-02 |
| 11133147 | Charged particle ray device and cross-sectional shape estimation program | Hajime Kawano, Kouichi Kurosawa, Hideyuki Kazumi, Chahn Lee | 2021-09-28 |
| 11011348 | Scanning electron microscope and sample observation method using scanning electron microscope | Daisuke Bizen, Natsuki Tsuno, Takafumi Miwa, Makoto Sakakibara, Hideyuki Kazumi | 2021-05-18 |