Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11143606 | Particle measuring device and particle measuring method | Tomihiro Hashizume, Masatoshi Yasutake, Tsunenori Nomaguchi | 2021-10-12 |
| 11043359 | Charged particle beam apparatus and charged particle beam inspection system | Yohei Nakamura, Natsuki Tsuno, Heita Kimizuka, Muneyuki Fukuda, Junichi Tanaka | 2021-06-22 |
| 11011348 | Scanning electron microscope and sample observation method using scanning electron microscope | Daisuke Bizen, Natsuki Tsuno, Makoto Sakakibara, Toshiyuki Yokosuka, Hideyuki Kazumi | 2021-05-18 |