Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11170969 | Electron beam observation device, electron beam observation system, and control method of electron beam observation device | Koichi Hamada, Megumi Kimura, Momoyo Enyama, Ryou YUMIBA, Kei Sakai +2 more | 2021-11-09 |
| 11011348 | Scanning electron microscope and sample observation method using scanning electron microscope | Daisuke Bizen, Natsuki Tsuno, Takafumi Miwa, Toshiyuki Yokosuka, Hideyuki Kazumi | 2021-05-18 |