Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11183362 | Charged particle beam apparatus and sample observation method using the same | Katsura Takaguchi, Natsuki Tsuno, Toshihide Agemura | 2021-11-23 |
| 11043358 | Measuring apparatus and method of setting observation condition | Ryoko Araki, Natsuki Tsuno, Yohei Nakamura, Mitsuhiro Nakamura, Toshihide Agemura | 2021-06-22 |
| 10971347 | Charged particle beam apparatus | Mitsuhiro Nakamura, Hironori ITABASHI, Hirofumi Satou, Tsutomu Saito, Natsuki Tsuno +1 more | 2021-04-06 |