Issued Patents 2021
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11189457 | Scanning electron microscope | Hideo Morishita | 2021-11-30 |
| 11183362 | Charged particle beam apparatus and sample observation method using the same | Katsura Takaguchi, Natsuki Tsuno, Masahiro Sasajima | 2021-11-23 |
| 11139143 | Spin polarimeter | Hideo Morishita, Teruo Kohashi | 2021-10-05 |
| 11107656 | Charged particle beam device | Tsunenori Nomaguchi, Shunichi Motomura, Kenichi Nishinaka | 2021-08-31 |
| 11043358 | Measuring apparatus and method of setting observation condition | Ryoko Araki, Natsuki Tsuno, Yohei Nakamura, Masahiro Sasajima, Mitsuhiro Nakamura | 2021-06-22 |
| 10886101 | Charged particle beam device | Ryo HIRANO, Hideo Morishita, Junichi Katane, Tsunenori Nomaguchi | 2021-01-05 |