Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11170972 | Scanning electron microscope and method for analyzing secondary electron spin polarization | Teruo Kohashi, Hideo Morishita | 2021-11-09 |
| 10886101 | Charged particle beam device | Ryo HIRANO, Hideo Morishita, Toshihide Agemura, Tsunenori Nomaguchi | 2021-01-05 |