Issued Patents 2020
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10847372 | Workpiece processing technique | Kevin Anglin, Ross Bandy | 2020-11-24 |
| 10823888 | Methods of producing slanted gratings with variable etch depths | Rutger Meyer Timmerman Thijssen, Joseph C. Olson | 2020-11-03 |
| 10818499 | Optical component having variable depth gratings and method of formation | John Hautala, Rutger Meyer Timmerman Thijssen, Joseph C. Olson | 2020-10-27 |
| 10795173 | System and method for optimally forming gratings of diffracted optical elements | Rutger Meyer Timmerman Thijssen, Joseph C. Olson, Peter Kurunczi | 2020-10-06 |
| 10775158 | System and method for detecting etch depth of angled surface relief gratings | Joseph C. Olson, Ludovic Godet, Rutger Meyer Timmerman Thijssen | 2020-09-15 |
| 10761334 | System and method for optimally forming gratings of diffracted optical elements | Rutger Meyer Timmerman Thijssen, Joseph C. Olson, Peter Kurunczi | 2020-09-01 |
| 10739208 | Semiconductor workpiece temperature measurement system | Klaus Petry, Jason M. Schaller, Ala Moradian | 2020-08-11 |
| 10692872 | Device structure for forming semiconductor device having angled contacts | Sony Varghese, Anthony Renau, John Hautala, Joe Olson | 2020-06-23 |
| 10690821 | Methods of producing slanted gratings | Rutger Meyer Timmerman Thijssen, Megan Clark | 2020-06-23 |
| 10607847 | Gate all around device and method of formation using angled ions | Min Gyu Sung, Sony Varghese, Anthony Renau, Joseph C. Olson | 2020-03-31 |
| 10600675 | Techniques and structure for forming thin silicon-on-insulator materials | Andrew Waite, John Hautala | 2020-03-24 |
| 10598832 | System and method for forming diffracted optical element having varied gratings | Rutger Meyer Timmerman Thijssen, Joseph C. Olson, Peter Kurunczi, Robert Masci | 2020-03-24 |
| 10553448 | Techniques for processing a polycrystalline layer using an angled ion beam | Tristan Y. Ma, Kevin Anglin, Robert Masci, John Hautala | 2020-02-04 |