Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10879055 | Techniques, system and apparatus for selective deposition of a layer using angled ions | Christopher R. Hatem | 2020-12-29 |
| 10847372 | Workpiece processing technique | Morgan Evans, Ross Bandy | 2020-11-24 |
| 10665421 | In-situ beam profile metrology | Tsung-Liang Chen, Simon Ruffell | 2020-05-26 |
| 10553448 | Techniques for processing a polycrystalline layer using an angled ion beam | Tristan Y. Ma, Morgan Evans, Robert Masci, John Hautala | 2020-02-04 |