Issued Patents 2019
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10437157 | Method and apparatus for image analysis | Markus Gerardus Martinus Maria Van Kraaij, Adrianus Cornelis Matheus Koopman, Stefan Hunsche, Willem Marie Julia Marcel Coene | 2019-10-08 |
| 10331041 | Metrology method and apparatus, lithographic system and device manufacturing method | Niels Geypen, Hendrik Jan Hidde Smilde, Alexander Straaijer, Maurits Van Der Schaar, Markus Gerardus Martinus Maria Van Kraaij | 2019-06-25 |
| 10295913 | Inspection method and apparatus, and corresponding lithographic apparatus | Rene A. M. Pluijms, Martyn John Coogans, Marc Johannes Noot | 2019-05-21 |
| 10274834 | Methods and apparatus for obtaining diagnostic information relating to an industrial process | Alexander Ypma, Jasper Menger, David Deckers, David Han, Adrianus Cornelis Matheus Koopman +3 more | 2019-04-30 |
| 10265040 | Method and apparatus for adaptive computer-aided diagnosis | Henricus Wilhelm van der Heijden | 2019-04-23 |