Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10274834 | Methods and apparatus for obtaining diagnostic information relating to an industrial process | Alexander Ypma, Jasper Menger, David Han, Adrianus Cornelis Matheus Koopman, Irina Lyulina +3 more | 2019-04-30 |
| 10191390 | Method for transferring a mark pattern to a substrate, a calibration method, and a lithographic apparatus | Paul Cornelis Hubertus Aben, Sanjaysingh Lalbahadoersing, Jurgen Johannes Henderikus Maria Schoonus | 2019-01-29 |