Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10437157 | Method and apparatus for image analysis | Scott Anderson Middlebrooks, Markus Gerardus Martinus Maria Van Kraaij, Adrianus Cornelis Matheus Koopman, Stefan Hunsche | 2019-10-08 |
| 10379448 | Methods and apparatus for predicting performance of a measurement method, measurement method and apparatus | Simon Gijsbert Josephus Mathijssen, Sander Bas Roobol, Nan Lin, Arie Jeffrey Den Boef | 2019-08-13 |
| 10234384 | Inspection apparatus and method, lithographic apparatus, method of manufacturing devices and computer program | Alexander Prasetya KONIJNENBERG | 2019-03-19 |