Issued Patents 2019
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10451559 | Illumination source for an inspection apparatus, inspection apparatus and inspection method | Peter Danny Van Voorst, Nan Lin, Simon Gijsbert Josephus Mathijssen, Sietse Thijmen Van Der Post | 2019-10-22 |
| 10379448 | Methods and apparatus for predicting performance of a measurement method, measurement method and apparatus | Simon Gijsbert Josephus Mathijssen, Nan Lin, Willem Marie Julia Marcel Coene, Arie Jeffrey Den Boef | 2019-08-13 |
| 10330606 | Illumination source for an inspection apparatus, inspection apparatus and inspection method | Peter Danny Van Voorst, Nan Lin, Simon Gijsbert Josephus Mathijssen, Sietse Thijmen Van Der Post | 2019-06-25 |
| 10267744 | Illumination source for an inspection apparatus, inspection apparatus and inspection method | Patricius Aloysius Jacobus Tinnemans, Nan Lin, Simon Gijsbert Josephus Mathijssen | 2019-04-23 |
| 10248029 | Method and apparatus for inspection and metrology | Sietse Thijmen Van Der Post, Ferry Zijp | 2019-04-02 |
| 10234771 | HHG source, inspection apparatus and method for performing a measurement | Nan Lin, Arie Jeffrey Den Boef, Simon Gijsbert Josephus Mathijssen, Niels Geypen | 2019-03-19 |