Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10451559 | Illumination source for an inspection apparatus, inspection apparatus and inspection method | Nan Lin, Sander Bas Roobol, Simon Gijsbert Josephus Mathijssen, Sietse Thijmen Van Der Post | 2019-10-22 |
| 10330606 | Illumination source for an inspection apparatus, inspection apparatus and inspection method | Nan Lin, Sander Bas Roobol, Simon Gijsbert Josephus Mathijssen, Sietse Thijmen Van Der Post | 2019-06-25 |
| 10185224 | Method and apparatus for inspection and metrology | Ferry Zijp, Duygu Akbulut, Jeroen Johan Maarten Van De Wijdeven, Koos Van Berkel | 2019-01-22 |