Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10248029 | Method and apparatus for inspection and metrology | Sietse Thijmen Van Der Post, Sander Bas Roobol | 2019-04-02 |
| 10185224 | Method and apparatus for inspection and metrology | Duygu Akbulut, Peter Danny Van Voorst, Jeroen Johan Maarten Van De Wijdeven, Koos Van Berkel | 2019-01-22 |