Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10514614 | Process variability aware adaptive inspection and metrology | Venugopal Vellanki, Vivek Jain | 2019-12-24 |
| 10459345 | Focus-dose co-optimization based on overlapping process window | Chiou-hung Jang, Marinus Jochemsen, Vito Tomasello | 2019-10-29 |
| 10437157 | Method and apparatus for image analysis | Scott Anderson Middlebrooks, Markus Gerardus Martinus Maria Van Kraaij, Adrianus Cornelis Matheus Koopman, Willem Marie Julia Marcel Coene | 2019-10-08 |