AB

Arie Jeffrey Den Boef

AB Asml Netherlands B.V.: 12 patents #5 of 568Top 1%
AN Asml Holding N.V.: 2 patents #13 of 50Top 30%
📍 Waalre, NL: #2 of 62 inventorsTop 4%
Overall (2017): #5,230 of 506,227Top 2%
12
Patents 2017

Issued Patents 2017

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
9835954 Inspection method and apparatus, substrates for use therein and device manufacturing method Erik Willem Bogaart, Franciscus Godefridus Casper Bijnen, Simon Gijsbert Josephus Mathijssen 2017-12-05
9778025 Method and apparatus for measuring asymmetry of a microstructure, position measuring method, position measuring apparatus, lithographic apparatus and device manufacturing method Simon Gijsbert Josephus Mathijssen, Erik Willem Bogaart, Patricius Aloysius Jacobus Tinnemans 2017-10-03
9704810 Method and apparatus for determining an overlay error 2017-07-11
9658528 Imprint lithography Yvonne Wendela Kruijt-Stegeman, Andre Bernardus Jeunink 2017-05-23
9632039 Inspection apparatus, inspection method and manufacturing method Simon Gijsbert Josephus Mathijssen, Nitesh Pandey, Stefan Michiel Witte, Kjeld Sijbrand Eduard Eikema 2017-04-25
9625811 Imprint lithography Sander Frederik Wuister, Yvonne Wendela Kruijt-Stegeman 2017-04-18
9606442 Position measuring apparatus, position measuring method, lithographic apparatus and device manufacturing method Simon Gijsbert Josephus Mathijssen 2017-03-28
9605947 Position measurement with illumination profile having regions confined to peripheral portion of pupil Justin Kreuzer, Simon Josephus Mathijssen 2017-03-28
9551939 Mark position measuring apparatus and method, lithographic apparatus and device manufacturing method Simon Gijsbert Josephus Mathijssen, Stanley Drazkiewicz, Justin Kreuzer, Gerrit Johannes Nijmeijer 2017-01-24
9547241 Alignment sensor, lithographic apparatus and alignment method Simon Gijsbert Josephus Mathijssen, Patricius Aloysius Jacobus Tinnemans 2017-01-17
9541843 Lithographic apparatus and device manufacturing method involving a sensor detecting a radiation beam through liquid Joeri Lof, Erik Theodorus Maria Bijlaart, Roelof Aeilko Siebrand Ritsema, Frank Van Schaik, Timotheus Franciscus Sengers +16 more 2017-01-10
9535322 Imprint lithography Andre Bernardus Jeunink, Sander Frederik Wuister, Yvonne Wendela Kruijt-Stegeman 2017-01-03