Issued Patents 2011
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8042070 | Methods and system for analysis and management of parametric yield | Paul Chang, Dureseti Chidambarrao, Praveen Elakkumanan, Jason D. Hibbeler, Anda C. Mocuta | 2011-10-18 |
| 7975244 | Methodology and system for determining numerical errors in pixel-based imaging simulation in designing lithographic masks | Maharaj Mukherjee, Alan E. Rosenbluth | 2011-07-05 |
| 7935638 | Methods and structures for enhancing perimeter-to-surface area homogeneity | John J. Ellis-Monaghan, Jeffrey P. Gambino, Kirk D. Peterson, Jed H. Rankin | 2011-05-03 |
| 7900178 | Integrated circuit (IC) design method, system and program product | Gregory A. Northrop, Ming Yin | 2011-03-01 |
| 7890906 | Method of laying out integrated circuit design based on known polysilicon perimeter densities of individual cells | Laura S. Chadwick, David J. Hathaway, Anthony D. Polson | 2011-02-15 |
| 7865864 | Electrically driven optical proximity correction | Shayak Banerjee, Praveen Elakkumanan, Lars Liebmann | 2011-01-04 |