Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8042070 | Methods and system for analysis and management of parametric yield | James A. Culp, Dureseti Chidambarrao, Praveen Elakkumanan, Jason D. Hibbeler, Anda C. Mocuta | 2011-10-18 |