Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8042070 | Methods and system for analysis and management of parametric yield | James A. Culp, Paul Chang, Dureseti Chidambarrao, Praveen Elakkumanan, Jason D. Hibbeler | 2011-10-18 |
| 7928513 | Protection against charging damage in hybrid orientation transistors | Terence B. Hook, Jeffrey W. Sleight, Anthony K. Stamper | 2011-04-19 |
| 7879650 | Method of providing protection against charging damage in hybrid orientation transistors | Terence B. Hook, Jeffrey W. Sleight, Anthony K. Stamper | 2011-02-01 |