Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8042070 | Methods and system for analysis and management of parametric yield | James A. Culp, Paul Chang, Dureseti Chidambarrao, Jason D. Hibbeler, Anda C. Mocuta | 2011-10-18 |
| 7865864 | Electrically driven optical proximity correction | Shayak Banerjee, James A. Culp, Lars Liebmann | 2011-01-04 |