Issued Patents 2011
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8067752 | Semiconductor testing method and semiconductor tester | Tohru Ando, Tsutomu Saito, Shinichi Kato, Takeshi Sunaoshi | 2011-11-29 |
| 7989766 | Sample inspection apparatus | Tohru Ando, Masahiro Sasajima, Tsutomu Saito, Tomoharu Obuki, Isamu Sekihara | 2011-08-02 |
| 7957579 | Pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Aritoshi Sugimoto, Maki Tanaka +2 more | 2011-06-07 |
| D637098 | Semiconductor testing machine | Mitsuru Oonuma, Akira Omachi, Kazuhiko Nishiyama, Hiroyuki Suzuki | 2011-05-03 |
| 7894658 | Pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Aritoshi Sugimoto, Maki Tanaka +2 more | 2011-02-22 |
| 7875156 | Probe storage container, prober apparatus, probe arranging method and manufacturing method of probe storage container | Masanori Gunji, Katsunori Nakajima, Tsutomu Saito, Shigeru Izawa | 2011-01-25 |