Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8067752 | Semiconductor testing method and semiconductor tester | Tohru Ando, Yasuhiko Nara, Shinichi Kato, Takeshi Sunaoshi | 2011-11-29 |
| 7989766 | Sample inspection apparatus | Yasuhiko Nara, Tohru Ando, Masahiro Sasajima, Tomoharu Obuki, Isamu Sekihara | 2011-08-02 |
| 7875156 | Probe storage container, prober apparatus, probe arranging method and manufacturing method of probe storage container | Masanori Gunji, Katsunori Nakajima, Yasuhiko Nara, Shigeru Izawa | 2011-01-25 |