Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8067752 | Semiconductor testing method and semiconductor tester | Tohru Ando, Yasuhiko Nara, Tsutomu Saito, Shinichi Kato | 2011-11-29 |
| 8040146 | Inspection apparatus having a heating mechanism for performing sample temperature regulation | Kouichi Kurosawa, Takeshi Sato, Masaaki Komori | 2011-10-18 |