Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8067752 | Semiconductor testing method and semiconductor tester | Yasuhiko Nara, Tsutomu Saito, Shinichi Kato, Takeshi Sunaoshi | 2011-11-29 |
| 7989766 | Sample inspection apparatus | Yasuhiko Nara, Masahiro Sasajima, Tsutomu Saito, Tomoharu Obuki, Isamu Sekihara | 2011-08-02 |