Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7989766 | Sample inspection apparatus | Yasuhiko Nara, Tohru Ando, Tsutomu Saito, Tomoharu Obuki, Isamu Sekihara | 2011-08-02 |
| 7932733 | Apparatus for detecting defect by examining electric characteristics of a semiconductor device | Hiroyuki Suzuki | 2011-04-26 |