Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6924891 | Method and apparatus for article inspection including speckle reduction | Avner Karpol, Emanuel Elysaf, Shimon Yalov, Boaz Kenan | 2005-08-02 |
| 6853446 | Variable angle illumination wafer inspection system | Gilad Almogy, Hadar Mazaki, Zvi Howard Phillip, Boris Goldberg, Daniel I. Some | 2005-02-08 |
| 6853475 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Emanuel Elyasaf, Nissim Elmaliach, Ron Naftali, Boris Golberg | 2005-02-08 |