Issued Patents 2005
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6943898 | Apparatus and method for dual spot inspection of repetitive patterns | Alexander Libinson, Haim Feldman, Daniel I. Some | 2005-09-13 |
| 6914670 | Defect detection with enhanced dynamic range | Gilad Almogy, Ron Naftali | 2005-07-05 |
| 6882417 | Method and system for detecting defects | Ron Naftali | 2005-04-19 |
| 6853446 | Variable angle illumination wafer inspection system | Gilad Almogy, Hadar Mazaki, Zvi Howard Phillip, Silviu Reinhorn, Daniel I. Some | 2005-02-08 |