Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6943898 | Apparatus and method for dual spot inspection of repetitive patterns | Alexander Libinson, Haim Feldman, Boris Goldberg | 2005-09-13 |
| 6853446 | Variable angle illumination wafer inspection system | Gilad Almogy, Hadar Mazaki, Zvi Howard Phillip, Silviu Reinhorn, Boris Goldberg | 2005-02-08 |