Issued Patents 2005
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6943898 | Apparatus and method for dual spot inspection of repetitive patterns | Alexander Libinson, Daniel I. Some, Boris Goldberg | 2005-09-13 |
| 6937343 | Laser scanner with amplitude and phase detection | — | 2005-08-30 |
| 6930770 | High throughput inspection system and method for generating transmitted and/or reflected images | Emanuel Elyasaf, Simon Yalov, Eitan Lahat | 2005-08-16 |
| 6853475 | Wafer defect detection system with traveling lens multi-beam scanner | Emanuel Elyasaf, Nissim Elmaliach, Ron Naftali, Boris Golberg, Silviu Reinhorn | 2005-02-08 |